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Volumn 21, Issue 8, 2005, Pages 781-794

A new S2-EWMA control chart for monitoring the process variance

Author keywords

EWMA; Logarithmic transformation; Sample variance

Indexed keywords

CONDITION MONITORING; OPTIMAL CONTROL SYSTEMS; PARAMETER ESTIMATION; PROCESS CONTROL;

EID: 13844274308     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.686     Document Type: Article
Times cited : (97)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.