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Volumn , Issue , 2003, Pages 93-98

An integrated neural concurrent system for pattern recognition: Basic element

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST PATTERN GENERATION; NEURAL NETWORKS; PATTERN RECOGNITION SYSTEMS; SIGNAL PROCESSING;

EID: 13844252603     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISP.2003.1275820     Document Type: Conference Paper
Times cited : (1)

References (20)
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    • An innovative way to measure the quality of a neural network without the use of the test set
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    • The system of handwritten characters recognition on the basis of legendre moments and neural network
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    • Selinger, M.1    Vatkin, M.2
  • 9
    • 0030128169 scopus 로고    scopus 로고
    • Orthogonal moment features for use with parametic and non-parametic classifiers
    • Apr.
    • Srinath M. Bailey R.R., "Orthogonal moment features for use with parametic and non-parametic classifiers," Pattern Analysis and Machine Intelligence Trans. on IEEE, vol. 18. no. 4, pp. 389-399, Apr. 1996.
    • (1996) Pattern Analysis and Machine Intelligence Trans. on IEEE , vol.18 , Issue.4 , pp. 389-399
    • Srinath, M.1    Bailey, R.R.2
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    • Jaynes, E.T.1
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    • Teague, M.R.1
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.