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Volumn 291, Issue , 2003, Pages 27-35
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New approach to analysis of the switching current data in ferroelectric thin films
a a a a |
Author keywords
Internal bias field; Preisach approach; Switching current; Thin films
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Indexed keywords
CRYSTAL GROWTH;
DATA REDUCTION;
MAGNETIC DOMAINS;
MAGNETIC HYSTERESIS;
SWITCHING;
THIN FILMS;
DOMAIN WALL;
INTERNAL BIAS FIELD;
PREISACH APPROACH;
SWITCHING CURRENT;
FERROELECTRIC MATERIALS;
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EID: 13744250409
PISSN: 00150193
EISSN: 15635112
Source Type: Conference Proceeding
DOI: 10.1080/00150190390222510 Document Type: Conference Paper |
Times cited : (26)
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References (17)
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