Seppen-Katamuki analysis of electron emission from chemical vapor deposited multiwall carbon nanotubes with and without laser irradiation

Technical Digest of the 17th International Vacuum Nanoelectronics Conference, IVNC 2004

Volumn , Issue , 2004, Pages 42-43

  Gotoh, Y ^a   Kawamura, Y ^a   Ishizu, K ^a   Tsuji, H ^a   Ishikawa, J ^a   Nakata, S ^b   Okuda, S ^b  

^a KYOTO UNIVERSITY   (Japan)

^b MITSUBISHI ELECTRIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; CHEMICAL VAPOR DEPOSITION; CURRENT VOLTAGE CHARACTERISTICS; ETCHING; FIELD EMISSION DISPLAYS; INDIUM COMPOUNDS; LASER BEAM EFFECTS; RAMAN SCATTERING; THRESHOLD VOLTAGE;

FOWLER-NORDHEIM PLOT; INDIUM TIN OXIDE (ITO) LAYERS; LASER FLUENCE; SEPPEN-KATAMUKI (S-K) ANALYSIS;

ELECTRON EMISSION;

EID: 13644270721     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. W. J. Zhao, N. Kawakami, A. Sawada, and M. Takai, J. Vac. Sci. Technol. B21 (2003) 1734.
2. Y. Gotoh, et al., J. Vac. Sci. Technol. B 18 (2000) 1018.
3. Y. Gotoh, et al., J. Appl. Phys. 95 (2004) 1537.