Reactions of monolayer Fe with Si(001)-dihydride and -2 × 1 surfaces

Surface Science

Volumn 357-358, Issue , 1996, Pages 931-936

  Hasegawa, M ^a   Kobayashi, N ^a   Hayashi, N ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

Iron; Low index single crystal surfaces; Medium energy ion scattering (MEIS); Reflection high energy electron diffraction (RHEED); Silicides; Silicon; Surface structure, morphology, roughness and topography

Indexed keywords

ANNEALING; CHEMICAL REACTIONS; DEPOSITION; IRON; MONOLAYERS; MORPHOLOGY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON; SINGLE CRYSTALS; SURFACE ROUGHNESS; SURFACE STRUCTURE;

LOW INDEX SINGLE CRYSTAL SURFACES; MEDIUM ENERGY ION SCATTERING; ROOM TEMPERATURE DEPOSITION; SILICIDES; SURFACE TOPOGRAPHY;

SURFACE PHENOMENA;

EID: 13544272162     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00294-4     Document Type: Article

References (12)

1. K.M. Geib, J.E. Mahan, R.G. Long, M. Nathan and G. Bai, J. Appl. Phys. 70 (1991) 1730; J. Derren, J. Chevrier, V. Le Thanh and J.E. Mahan, Appl. Surf. Sci. 56-58 (1992) 382; A. Rizzi, B.N.E. Rosen, D. Freundt, Ch. Dieker and H. Luth, Phys. Rev. B 51 (1995) 11780.
2. K.M. Geib, J.E. Mahan, R.G. Long, M. Nathan and G. Bai, J. Appl. Phys. 70 (1991) 1730; J. Derren, J. Chevrier, V. Le Thanh and J.E. Mahan, Appl. Surf. Sci. 56-58 (1992) 382; A. Rizzi, B.N.E. Rosen, D. Freundt, Ch. Dieker and H. Luth, Phys. Rev. B 51 (1995) 11780.
3. K.M. Geib, J.E. Mahan, R.G. Long, M. Nathan and G. Bai, J. Appl. Phys. 70 (1991) 1730; J. Derren, J. Chevrier, V. Le Thanh and J.E. Mahan, Appl. Surf. Sci. 56-58 (1992) 382; A. Rizzi, B.N.E. Rosen, D. Freundt, Ch. Dieker and H. Luth, Phys. Rev. B 51 (1995) 11780.
4. J. Alvarez, J.J. Hinarejos, E.G. Michel and R. Miranda, Surf. Sci. 269/270 (1992) 1011.
5. For example see: K. Oura, K. Sumitomo, T. Kobayashi, T. Kinoshita, Y. Tanaka, F. Shoji and I. Katayama, Surf. Sci. 254 (1991) L460.
6. M.H. Mendenhall and R.A. Weller, Nucl. Instr. Meth. B 47 (1990) 193; M. Hasegawa, N. Kobayashi and N. Hayashi, Bull. Electrotechnical Laboratory 11&12 (1994) 113.
7. M.H. Mendenhall and R.A. Weller, Nucl. Instr. Meth. B 47 (1990) 193; M. Hasegawa, N. Kobayashi and N. Hayashi, Bull. Electrotechnical Laboratory 11&12 (1994) 113.
8. K. Konuma, J. Vrijmoeth, P.M. Zagwijin, J.W. Frenken, E. Vlieg and J.F. Van der Veen, J. Appl. Phys. 73 (1993) 1104.
9. T. Sakurai and H.D. Hagstrum, Phys. Rev. B 14 (1976) 1593.
10. Y. Morita, K. Miki and H. Tokumoto, Appl. Phys. Lett. 59 (1991) 1347.
11. J.P. Becker, R.G. Long and J.E. Mahan, J. Vac. Sci. Technol. A 12 (1994) 174.
12. Pearson's Handbook of Cristallographic Data for Intermetallic Phases, 2nd ed., Vol. 2, Eds. P. Villars and L.D. Calvert (ASM International, Materials Park, Ohio, 1991) p. 3379; JCPDS 38-438.