Simulation of scanning tunneling microscope images of 1,3-cyclohexadiene bound to a silicon surface

Journal of Physical Chemistry B

Volumn 109, Issue 4, 2005, Pages 1473-1480

  Galperin, M ^a,b   Beratan, D N ^a  

^a DUKE UNIVERSITY   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON-ELECTRON INTERACTION; MOLECULAR CHARGING; MOLECULAR ORBITALS;

CHEMICAL BONDS; COMPUTER SIMULATION; ELECTRONIC STRUCTURE; HAMILTONIANS; IMAGE ANALYSIS; LAPLACE TRANSFORMS; SCANNING ELECTRON MICROSCOPY; SILICON; SURFACE CHEMISTRY;

AROMATIC COMPOUNDS;

1,3 CYCLOHEXADIENE; 1,3-CYCLOHEXADIENE; CYCLOHEXENE DERIVATIVE; SILICON;

ARTICLE; CHEMICAL STRUCTURE; CHEMISTRY; METHODOLOGY; QUANTUM THEORY; SCANNING TUNNELING MICROSCOPY; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTY;

CYCLOHEXENES; MICROSCOPY, SCANNING TUNNELING; MODELS, MOLECULAR; QUANTUM THEORY; SENSITIVITY AND SPECIFICITY; SILICON; SURFACE PROPERTIES;

EID: 13544270864     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp045783f     Document Type: Article

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