Quantitative phonon spectroscopy of interstitial oxygen in silicon

Physica B: Condensed Matter

Volumn 219-220, Issue 1-4, 1996, Pages 763-765

  Wurster, C ^a   Dittrich, E ^a   Scheitler, W ^a   Lassmann K ^a   Eisenmenger, W ^a   Zulehner, W ^b  

^a UNIVERSITY OF STUTTGART   (Germany)

^b WACKER CHEMIE AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC WAVE SCATTERING; OXYGEN; PHONONS; SEMICONDUCTING SILICON; SPECTROSCOPY; SUPERCONDUCTING DEVICES; TUNNEL JUNCTIONS;

INTERSTITIAL OXYGEN; PHONON TRANSMISSION SPECTRA; RESONANT PHONON SCATTERING;

CRYSTAL IMPURITIES;

EID: 13544257522     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(95)00878-0     Document Type: Article

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