Time evolution of sigma 3 annealing twins in secondary recrystallized nickel

Journal of Microscopy

Volumn 217, Issue 2, 2005, Pages 162-166

  Booth, M ^a   Randle, V ^a   Owen, G ^a  

^a SWANSEA UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; GRAIN BOUNDARIES; NICKEL;

ANNEALING TWINS; COARSE-GRAINED; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; FINE GRAINED; GRAIN-BOUNDARY MISORIENTATIONS; GROWTH CHARACTERISTIC; ORIENTATION MAPPING; PURE NICKELS; TIME EVOLUTIONS;

GRAIN GROWTH;

NICKEL;

ANNEALING; CELL NUCLEUS; CONFERENCE PAPER; CRYSTAL STRUCTURE; CRYSTALLIZATION; ELECTRON BACKSCATTER DIFFRACTION; ELECTRON DIFFRACTION; GRAIN; GRAIN BOUNDARY MISORIENTATION; MECHANICAL PROBE; METAL EXTRACTION; ORIENTATION; PRIORITY JOURNAL; SURFACE PROPERTY; TIME;

EID: 13444311621     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2005.01422.x     Document Type: Conference Paper

References (8)

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