Kinetics and mechanism of the formation of Ag nanoparticles by electrochemical techniques: A plasmon and cluster time-resolved spectroscopic study

Journal of Physical Chemistry B

Volumn 109, Issue 3, 2005, Pages 1183-1191

  Rodríguez Sánchez, M Luisa ^a   Rodríguez, M José ^a   Blanco, M Carmen ^a   Rivas, José ^a   López Quintela, M Arturo ^a  

^a UNIVERSITY OF SANTIAGO DE COMPOSTELA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMISTRY; ELECTRODEPOSITION; ELECTRON TRANSITIONS; POSITIVE IONS; REACTION KINETICS; SILVER; ULTRAVIOLET SPECTROSCOPY;

ELECTROCHEMICAL TECHNIQUES; KINETIC FITTINGS; PARTICLE FORMATION; PRECURSORS;

NANOSTRUCTURED MATERIALS;

NANOPARTICLE; SILVER;

ARTICLE; CHEMISTRY; ELECTROCHEMISTRY; KINETICS; METHODOLOGY; PARTICLE SIZE; SENSITIVITY AND SPECIFICITY; SURFACE PLASMON RESONANCE; TIME; ULTRAVIOLET SPECTROPHOTOMETRY;

ELECTROCHEMISTRY; KINETICS; NANOPARTICLES; PARTICLE SIZE; SENSITIVITY AND SPECIFICITY; SILVER; SPECTROPHOTOMETRY, ULTRAVIOLET; SURFACE PLASMON RESONANCE; TIME FACTORS;

EID: 13444310803     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp046056n     Document Type: Article

References (61)

1. Králik, M.; Biffis, A. J. Mol. Catal. A: Chem. 2001, 177, 113.
2. Schatz, G. C. Electromagnetic Mechanism of Surface-Enhanced Spectroscopy. In Handbook of Vibrational Spectroscopy; Chalmers, J. M., Griffiths, P. R., Eds.; John Wiley & Sons: Chichester, U.K., 2002; pp 1-16.
3. Sellmyer, D. J.; Yu, M.; Kirby, R. D. Nanostruct. Mater. 1999, 12, 1021.
4. Shipway, A. N.; Katz, E.; Willner, I. ChemPhysChem 2000, 1, 18.
5. López-Quintela, M. A. Curr. Opin. Colloid Interface Sci. 2003, 8, 137.
6. Manna, A.; Imae, T.; Iida, M.; Hisamatsu, N. Langmuir 2001, 17, 6000.
7. Kiwi, J.; Grätzel, M. J. Am. Chem. Soc. 1979, 101, 7214.
8. Reetz, M. T.; Helbig, W. J. Am. Chem. Soc. 1994, 116, 7401.
9. Zova, J. V.; Stieger, R. M.; Biernacki, P. R.; Penner, R. M. J. Phys. Chem. 1996, 100, 837.
10. Hodes, G., Ed. Electrochemistry of Nanomaterials; Wiley-VCH: Weinheim, Germany, 2001.
11. Rodríguez-Sánchez, L.; López-Quintela, M. A.; Blanco, M. C. J. Phys. Chem. B 2000, 104, 9683.
12. Pascal, C.; Pascal, J. L.; Favier, F.; Elidrissi Moubtassim, M. L.; Payen, C. Chem. Mater. 1999, 11, 141.
13. Chang, S.-S.; Shih, C.-W.; Chen, C.-D.; Lai, W.-C.; Wang, C. R. C. Langmuir 1999, 15, 701.
14. Reetz, M. T.; Winter, M.; Breinbauer, R.; Thurn-Albrecht, T.; Vogel, W. Chem.-Eur. J. 2001, 7, 1084.
15. Maier, S. A.; Kik, P. G.; Atwater, H. A.; Meltzer, S.; Requicha, A. A. G.; Koel, B. E. Proc. SPIE-Int. Soc. Opt. Eng. 2003, 4810.
16. Sandell, E. B. Colorimetric Metal Analysis; Interscience Publishers: New York, 1959.
17. Rodríguez-Sánchez, L. Ph.D. Thesis, University of Santiago de Compostela, Spain, 2003.
18. Henglein, A.; Schnabel, W.; Wendenburg, J. Einführung in die Strahlenchemie; Verlag Chemie: Weinheim, Germany, 1969.
19. Henglein, A. Chem. Phys. Lett. 1989, 154, 473.
20. Henglein, A.; Linnert, T.; Mulvaney, P. Ber. Bunsen-Ges. Phys. Chem. 1990, 94, 1449.
21. Tausch-Treml, R.; Henglein, A.; Lilie, J. Ber. Bunsen-Ges. Phys. Chem. 1978, 82, 1335.
22. Ershov, B. G.; Janata, E.; Henglein, A.; Fojtik, A. J. Phys. Chem. 1993, 97, 4589.
23. Linnert, T.; Mulvaney, P.; Henglein, A. J. Phys. Chem. 1991, 97, 679.
24. Mulvaney, P.; Henglein, A. J. Phys. Chem. 1990, 94, 4182.
25. Zheng, J.; Dickson, R. M. J. Am. Chem. Soc. 2002, 124, 13982.
26. Maali, A.; Cardinal, T.; Treguer-Delapierre, M. Physica E 2003, 17, 559.
27. Felix, C.; Sieber, C; Harbich, W.; Buttet, J.; Rabin, I.; Schulze, W.; Ertl, G. Phys. Rev. Lett. 2001, 86, 2992.
28. Peyser, L. A.; Vinson, A. E.: Bartko, A. P.; Dickson, R. M. Science 2001, 291, 103.
29. Kittel, C. Introduction to Solid State Physics, 2nd ed.; Wiley: New York, 1956.
30. Henglein, A. J. Phys. Chem. 1993, 97, 5457.
31. Mulvaney, P. Langmuir 1996, 12, 788.
32. Wiegel, E. Z Phys. 1954, 136, 642.
33. Pohl, R. W. Einführung in die Optik, 7th and 8th eds.; Springer-Verlag: Berlin, Germany, 1948; pp 209.
34. See, for example, the following: Lyon L. A.; Peña, D. J.; Natan, M. J. J. Phys. Chem. B 1999, 103, 5826.
35. Henglein, A. J. Phys. Chem. 1979, 83, 2209, 2858.
36. Henglein, A. Ber. Bunsen-Ges. Phys. Chem. 1980, 84, 253.
37. Underwood, S.; Mulvaney, P. Langmuuir 1994, 10, 3427.
38. Wilcoxon, J. P.; Williamson, R. L.; Baughman, R. J. J. Chem. Phys. 1993, 98, 993.
39. Torgoe, K.; Nakajima, Y.; Esumi, K. J. Phys. Chem. 1993, 97, 8304.
40. Esumi, K.; Shiratori, M.; Ishizuka, H.; Tano, T.; Torigoe, K.; Meguro, K. Langmuir 1991, 7, 457.
41. Malinsky, M. D.; Kelly, K. L.; Schatz, G. C.; Van Duyne, R. P. J. Am. Chem. Soc. 2001, 123, 1471.
42. Charlé, K. P.; König, L.; Rabin, I.; Schulze, W. Z. Phys. D: At., Mol. Clusters 1996, 36, 159.
43. Harbich, W.; Fedrigo, S.; Buttet, J. Z. Phys. D: At., Mol. Clusters 1993, 26, 138.
44. Kreibig, U.; Fragstein, C. V. Z. Phys. 1969, 224, 307.
45. Fragstein, C. V.; Römer, H. Z. Phys. 1958, 151, 54.
46. Doyle, W. T. Phys. Rev. 1958, 111, 1067.
47. Hampe, W. Z. Phys. 1958, 152, 470.
48. Heilweil, E. J.; Hochstrasser, R. M. J. Chem. Phys. 1985, 82, 4762-4770.
49. Molina, R. A.; Weinmann, D.; Jalabert, R. A. Phys. Rev. B: Solid State 2002, 65, 155427.
50. Kreibig, U.; Vollmer, M. Optical Properties of Metal Clusters; Springer-Verlag: Berlin, Germany, 1995.
51. Knigtb, W. D.; Clemenger, K.; de Heer, W. A.; Saunders, W. A.; Chou, M. Y.; Cohen, M. L. Phys. Rev. Lett. 1984, 52, 2141.
52. Gölich, H.; Lange, T.; Bergmann, T.; Martin, T. P. Phys. Rev. Lett. 1990, 65, 748.
53. Eckardt, W. Phys. Rev. B: Solid State 1984, 29, 1558.
54. Cao, P.; Sun, Y.; Gu, R. J. Phys. Chem. B 2003, 107, 5818.
55. Petit, C.; Lixon, P.; Pileni, M.-P. J. Phys. Chem. 1993, 97, 12974.
56. Ershov, B. G.; Janata, E.; Henglein, A.; Fojtik, A. J. Phys. Chem. 1993, 97, 4589.
57. Henglein, A.; Trausch-Treml, R. J. Colloid Interface Sci. 1981, 80, 84.
58. Maier, S. A.; Kik, P. G.; Atwater, H. A.; Meltzer, S.; Harel, E.; Koel, B. E.; Requicha, A. A. G. Nat. Mater. 2003, 2, 229.
59. Michaels, A. M.; Nirmal, M.; Brus, L. E. J. Am. Chem. Soc. 1999, 121, 9932.
60. Krenn, J. R.; Dereux, A.; Weeber, J. C.; Bourillot, E.; Lacroute, Y.; Goudonnet, J. P.; Shider, G.; Gotshy, W.; Leitner, A.; Aussenegg, F. R.; Girard, C. Phys. Rev. Lett. 1999, 82, 2590.
61. Mar, T.; Perner, M.; Grosse, S.; von Plessen, G.; Spirkl, W.; Feldman, J. Phys. Rev. Lett. 1998, 80, 4249.