The use of combined cathodoluminescence and EBSD analysis: A case study investigating grain boundary migration mechanisms in quartz

Journal of Microscopy

Volumn 217, Issue 2, 2005, Pages 152-161

  Piazolo, Sandra ^a,c   Prior, D J ^a   Holness, M D ^b  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c STOCKHOLM UNIVERSITY   (Sweden)

Author keywords

Cathodoluminescence; Crystallographic orientation; Dauphin twin; EBSD; Grain boundary migration; Grain growth; Static annealing; Subgrain

Indexed keywords

CATHODOLUMINESCENCE; GRAIN BOUNDARIES; IGNEOUS ROCKS; QUARTZ; TRACE ELEMENTS;

CRYSTALLOGRAPHIC ORIENTATIONS; DAUPHINÉ TWIN; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION ANALYSIS; GRAIN BOUNDARY MIGRATIONS; GROWTH INTERFACES; STATIC ANNEALING; SUBGRAINS; TWIN BOUNDARIES;

GRAIN GROWTH;

METAL DERIVATIVE; SILICON DIOXIDE;

CATHODE LUMINESCENCE; CHEMICAL MODIFICATION; CONFERENCE PAPER; CRYSTALLIZATION; CRYSTALLOGRAPHY; ELECTRON BACKSCATTER DIFFRACTION; ELECTRON DIFFRACTION; ENERGY; GRAIN BOUNDARY MIGRATION; LUMINESCENCE; MICROMORPHOLOGY; ORIENTATION; PRIORITY JOURNAL; PROCESS DESIGN; STRAIN IDENTIFICATION; STRUCTURE ANALYSIS;

EID: 13444273210     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2005.01423.x     Document Type: Conference Paper

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