Plan-view and cross-sectional characterization of thiourea-treated phosphorus-added steel surface

Journal of Electron Microscopy

Volumn 53, Issue 5, 2004, Pages 553-556

  Sato, Kaoru ^a   Sakurai, Michitaka ^a,b   Taira, Shoichiro ^a,b   Hamada, Etsuo ^a,b  

^a JFE STEEL CORPORATION   (Japan)

^b JFE Mineral Co   (Japan)

Author keywords

Focused ion beam; Low voltage scanning electron microscopy; Phosphorus added steel; Scanning ion microscopy; Surface modification

Indexed keywords

PHOSPHORUS; STEEL; THIOUREA;

ARTICLE; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY;

MICROSCOPY, ELECTRON, SCANNING; PHOSPHORUS; STEEL; SURFACE PROPERTIES; THIOUREA;

COLD ROLLING; GRAIN SIZE AND SHAPE; IONS; METAL CLADDING; STEEL; STEEL SHEET; THIOUREAS;

COATED STEEL; COLD ROLLED STEEL; FOCUSED IONS BEAMS; GALVANISING; GALVANNEALING; LOW VOLTAGE SCANNING ELECTRON MICROSCOPIES; PHOSPHORUS-ADDED STEEL; SCANNING ION MICROSCOPY; STEEL SURFACE; SURFACE-MODIFICATION;

SCANNING ELECTRON MICROSCOPY;

EID: 13444267895     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/dfh060     Document Type: Article

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