Microscopic structure in pressure sensitive adhesives: An ultrasmall angle X-ray study

Physica B: Condensed Matter

Volumn 357, Issue 1-2 SPEC. ISS., 2005, Pages 144-147

  Maurer, E ^a   Loi, S ^a   Wulff, D ^b   Willenbacher, N ^b   Muller Buschbaum P ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b BASF SE   (Germany)

Author keywords

Adhesive; Asymmetry; In situ; USAX

Indexed keywords

ADHESIVES; ALCOHOLS; COPOLYMERS; DEBONDING; HYDRODYNAMICS; OPTICAL MICROSCOPY; POLYMETHYL METHACRYLATES; STATISTICAL METHODS; STRESS ANALYSIS; SURFACE TENSION; X RAY SCATTERING;

ASYMMETRY; MICROSCOPIC STRUCTURES; PRESSURE SENSITIVE ADHESIVES (PSA); ULTRASMALL ANGLE X-RAY SCATTERING (USAX);

SURFACE STRUCTURE;

EID: 13444262285     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2004.11.044     Document Type: Conference Paper

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