Substrate morphology repetition in "thick" polymer films

Physica B: Condensed Matter

Volumn 357, Issue 1-2 SPEC. ISS., 2005, Pages 136-140

  Pietsch, Ullrich ^a   Panzner, Tobias ^a   Pfeiffer, Franz ^b   Robinson, Ian K ^c  

^a UNIVERSITY OF POTSDAM   (Germany)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c University of Illinois at Urbana Champaign   (United States)

Author keywords

Polymer surface morphology; Synchrotron radiation; X ray reflectivity

Indexed keywords

GLASS TRANSITION; PLASTIC FILMS; SILICON; SPIN COATING; SUBSTRATES; SURFACES; SYNCHROTRON RADIATION; THICK FILMS; X RAY SCATTERING;

DENSITY FLUCTUATION; POLYMER DENSITY; POLYMER SURFACE MORPHOLOGY; ROOM TEMPERATURE; X-RAY REFLECTIVITY;

MORPHOLOGY;

EID: 13444254200     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2004.11.042     Document Type: Conference Paper

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