Metrology system for the Terrestrial Planet Finder coronagraph

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5528, Issue , 2004, Pages 22-31

  Shaklan, Stuart ^a,b   Marchen, Luis ^a   Zhao, Feng ^a   Peters, Robert D ^a   Ho, Tim ^a   Holmes, Buck ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; DIFFRACTION; ELECTROOPTICAL EFFECTS; IMAGE PROCESSING; INTERFEROMETRY; MODULATORS; NATURAL FREQUENCIES; PLANETS; SPACE TELESCOPES; THERMAL EXPANSION; THROUGHPUT;

DEFORMABLE MIRRORS (DM); LYOT PUPIL EFFICIENCY; TERRESTRIAL PLANET FINDERS (TPF); TPF CORONAGRAPHS (TPF-C);

SPACE OPTICS;

EID: 13444249943     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.559998     Document Type: Conference Paper

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