Markov Edit Distance

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 26, Issue 3, 2004, Pages 311-321

  Wei, Jie ^a,b  

^a IEEE   (United States)

^b CITY COLLEGE OF NEW YORK   (United States)

Author keywords

Dynamic programming; Edit distance; Markov Random Field; Pattern recognition; Statistical dependency; Text processing

Indexed keywords

MARKOV EDIT DISTANCES (MED); MARKOV RANDOM FIELDS; STATISTICAL DEPENDENCY;

ALGORITHMS; COMPUTER VISION; DYNAMIC PROGRAMMING; INFORMATION THEORY; MARKOV PROCESSES; OPTIMIZATION; SPEECH RECOGNITION; STATISTICAL METHODS; TEXT PROCESSING; WORD PROCESSING;

PATTERN MATCHING;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; COMPARATIVE STUDY; COMPUTER ASSISTED DIAGNOSIS; EVALUATION; IMAGE ENHANCEMENT; IMAGE SUBTRACTION; INFORMATION RETRIEVAL; MATHEMATICAL COMPUTING; METHODOLOGY; PROBABILITY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING; STATISTICAL MODEL;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; INFORMATION STORAGE AND RETRIEVAL; MARKOV CHAINS; MODELS, STATISTICAL; NUMERICAL ANALYSIS, COMPUTER-ASSISTED; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING, COMPUTER-ASSISTED; SUBTRACTION TECHNIQUE;

EID: 1342345780     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2004.1262315     Document Type: Article

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