A study of the crystal structure of a commercial β-SiC whisker by high-resolution TEM

Materials Chemistry and Physics

Volumn 84, Issue 2-3, 2004, Pages 243-246

  Geng, L ^a   Zhang, J ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Ceramics; Composite materials; High resolution transmission electron microscopy; Microstructure

Indexed keywords

CERAMIC MATERIALS; COMPOSITE MATERIALS; CRYSTAL STRUCTURE; CRYSTAL WHISKERS; INTERFACES (MATERIALS); MICROSTRUCTURE; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

HEXAGONAL CLOSE PACKED (HCP) DIFFRACTION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM); MICROTWINS;

SILICON CARBIDE;

EID: 1342344537     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(03)00281-5     Document Type: Article

References (8)

1. Geng L., Ochiai S., Hu J.Q., Yao C.K. Mater. Sci. Eng. A. 246:1998;302.
2. Ye F., Lei T.Q., Zhou Y. Mater. Sci. Eng. A. 281:2000;305.
3. Ma Z.Y., Lu Y.X., Luo M., Bi J. J. Mater. Sci. Technol. 11:1995;291.
4. Nutt S.R. J. Am. Ceram. Soc. 71:1988;149.
5. Nutt S.R. J. Am. Ceram. Soc. 67:1984;428.
6. Yan Y., Chen J., Wang L., Li Q., Feng D., Cao L., Yao C. Mater. Lett. 8:1989;305.
7. Liu Q., Wu K., Geng L., Yao C.K. Mater. Sci. Eng. A. 130:1990;113.
8. Milewski J.V., Gac F.D., Petrovic J.J., Skaggs S.R. J. Mater. Sci. 20:1985;1160.