SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 447-448, Issue , 2004, Pages 558-563

Investigation of quaternary Al-based quasicrystal thin films for corrosion protection

(5) Balbyshev, V N a,b King, D J c Khramov, A N a,b Kasten, L S d Donley, M S b

a UNIVERSAL TECHNOLOGY CORPORATION (United States)

b AIR FORCE RESEARCH LABORATORY (United States)

c Technology Assessment and Transfer (United States)

d UNIVERSITY OF DAYTON RESEARCH INSTITUTE (United States)

Author keywords

Al alloy; Corrosion protection; Quasicrystal film

Indexed keywords

CORROSION PROTECTION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; MICROSTRUCTURE; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PROTECTIVE COATINGS; SCANNING ELECTRON MICROSCOPY; SURFACE CHEMISTRY; SURFACE TREATMENT; THERMAL CONDUCTIVITY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

INSULATOR ALLOYS; QUASICRYSTAL FILMS;

QUASICRYSTALS;

EID: 1342326331 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2003.07.026 Document Type: Conference Paper

Times cited : (44)

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