SCOPUS 정보 검색 플랫폼

Physica Status Solidi Conferences

Volumn , Issue 2, 2003, Pages 771-775

Acceptor states detection by microwave and current modulation spectroscopy

(2) Chernikov, M A a Ryabushkin, O A b

a IRE Polus Ltd (Russian Federation)

b RUSSIAN ACADEMY OF SCIENCES (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; ELECTRIC CURRENTS; ELECTRIC FIELDS; FREQUENCY MODULATION; HELIUM NEON LASERS; LIGHT REFLECTION; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROWAVES; NUCLEAR MAGNETIC RESONANCE; OPTICAL FIBERS; PERMITTIVITY; QUANTUM THEORY; SPECTROSCOPIC ANALYSIS; MOLECULAR SPECTROSCOPY; OHMIC CONTACTS; OPTICAL PROPERTIES; REFLECTION;

CURRENT MODULATION; OPTICAL SPECTROSCOPY; AMPLITUDE MODULATED; HOT ELECTRON EFFECTS; INTENSITY-MODULATED; MICROWAVE ELECTRIC FIELD; MODULATION FREQUENCIES; SEMICONDUCTOR STRUCTURE;

SEMICONDUCTOR MATERIALS; MODULATION;

EID: 1342326293 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: 10.1002/pssc.200306209 Document Type: Conference Paper

Times cited : (1)

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