Effects of subgrains on critical current properties in melt-processed RE-Ba-Cu-O bulk superconductors

Superconductor Science and Technology

Volumn 17, Issue 2, 2004, Pages

  Ogasawara, Kei ^a   Sakai, Naomichi ^a   Koblischka, Michael R ^b   Koblischka Veneva, Anjela ^b   Murakami, Masato ^a,c  

^a SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

^b SAARLAND UNIVERSITY   (Germany)

^c SHIBAURA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BACKSCATTERING DIFFRACTION TECHNIQUE; SUBGRAINS;

BARIUM COMPOUNDS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL GROWTH FROM MELT; CRYSTAL ORIENTATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MAGNETIC FIELD EFFECTS; MAGNETIC VARIABLES MEASUREMENT;

OXIDE SUPERCONDUCTORS;

EID: 1342325152     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/17/2/063     Document Type: Article

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