Dimensional crossover in the effective second-harmonic generation of films of random dielectrics

Physical Review B - Condensed Matter and Materials Physics

Volumn 69, Issue 1, 2004, Pages

  Hui, P M ^a   Xu, C ^a,b   Stroud, D ^c  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b SOOCHOW UNIVERSITY   (China)

^c OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CALCULATION; DIELECTRIC CONSTANT; ELECTRIC FIELD; FILM; MATHEMATICAL ANALYSIS; NONLINEAR SYSTEM; SIMULATION; THICKNESS; VALIDATION PROCESS;

EID: 1342322907     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.014202     Document Type: Article

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