Influence of structure-actuator interactions and temperature piezoelectric mechatronic signatures for NDE

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5062, Issue 1, 2002, Pages 263-269

  Bhalla, Suresh ^a   Naidu, Akshay S K ^a   Soh, Chee Kiong ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Conductance; Damage detection; Electro mechanical coupling; Mechatronic impedance transducer (MIT); Piezoelectric ceramic (PZT) patch; Structural health monitoring; Temperature effects

Indexed keywords

ACTUATORS; BONDING; ELECTRIC CONDUCTANCE; MECHATRONICS; NONDESTRUCTIVE EXAMINATION; THERMAL EFFECTS;

DAMAGE DETECTION; ELECTROMECHANICAL COUPLING; IMPEDANCE TRANSDUCERS; PIEZOELECTRIC MECHATRONIC SIGNATURES; STRUCTURE ACTUATOR INTERACTIONS;

PIEZOELECTRIC DEVICES;

EID: 1342311973     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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