State of the art in large format IR FPA development at CMC Electronics Cincinnati

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5074, Issue , 2003, Pages 60-71

  Greiner, M ^a   Davis, M ^a   Devitt, J ^a   Rawe, R ^a   Wade, D ^a   Voelker, J ^a  

^a CMC Electronics   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED DETECTORS; INTEGRATED CIRCUIT LAYOUT; SENSORS; SILICON WAFERS;

INDIUM ANTIMONIDE FOCAL PLANE ARRAYS; PERFORMANCE DATA; PIXELS; WAFER SIZE;

ARRAYS;

EID: 1342311255     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.487644     Document Type: Conference Paper

References (0)