Pile-ups in thin foils: Application to transmission electron microscopy analysis of short-range-order

Philosophical Magazine

Volumn 84, Issue 8, 2004, Pages 807-824

  Saada, G ^a   Douin, J ^a   Pettinari Sturmel, F ^b   Coujou, A ^b   Clement N ^b  

^a CNRS   (France)

^b CEMES CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; DEFORMATION; DISLOCATIONS (CRYSTALS); NICKEL ALLOYS; STRESS RELAXATION; SURFACE PROPERTIES; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

CHEMICAL FORCE; CLUSTERS; FREE SURFACES; SHORT RANGE ORDER; SHORT-RANGE-ORDER; THIN FOILS;

METAL FOIL;

EID: 1342303544     PISSN: 14786435     EISSN: None     Source Type: Journal    
DOI: 10.1080/14786430310001646718     Document Type: Article

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