On the importance of considering the incident spectrum when measuring the outdoor performance of amorphous silicon photovoltaic devices

Measurement Science and Technology

Volumn 15, Issue 2, 2004, Pages 460-466

  Gottschalg, R ^a   Betts, T R ^a   Infield, D G ^a   Kearney, M J ^b  

^a LOUGHBOROUGH UNIVERSITY   (United Kingdom)

^b UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

Calibration; Outdoor measurement of solar cells; Performance

Indexed keywords

AMORPHOUS SILICON; ERROR ANALYSIS; PHOTOVOLTAIC CELLS; SOLAR CELLS;

PYRANOMETERS; SPECTRAL DISTRIBUTIONS;

MEASUREMENT THEORY;

MEASUREMENT METHOD; PHOTOVOLTAIC SYSTEM;

EID: 1342287001     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/15/2/021     Document Type: Article

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