On-Line Monitoring of the Density of Linear Low-Density Polyethylene in a Real Plant by Near-Infrared Spectroscopy and Chemometrics

Applied Spectroscopy

Volumn 58, Issue 2, 2004, Pages 248-255

  Watari, Masahiro ^a,b   Higashiyama, Hisamitsu ^a,c   Mitsui, Naoto ^a   Tomo, Masahiro ^a   Ozaki, Yukihiro ^b  

^a YOKOGAWA ELECTRIC CORPORATION   (Japan)

^b KWANSEI GAKUIN UNIVERSITY   (Japan)

^c ST Japan Inc   (Japan)

Author keywords

Chemometrics; Density; Near infrared spectroscopy; NIR spectroscopy; On line monitoring; Partial least squares; PLS; Polyethylene

Indexed keywords

INFRARED SPECTROSCOPY; LEAST SQUARES APPROXIMATIONS; LINEAR LOW DENSITY POLYETHYLENES; MATHEMATICAL MODELS; MOLTEN MATERIALS; MONITORING; ONLINE SYSTEMS; REGRESSION ANALYSIS; SAMPLING;

CHEMOMETRICS; ON-LINE MONITORING;

PLANTS (BOTANY);

POLYETHYLENE;

ARTICLE; CHEMICAL INDUSTRY; COMPUTER AIDED DESIGN; DENSITOMETRY; INFRARED SPECTROSCOPY; INSTRUMENTATION; MATERIALS; METHODOLOGY; ONLINE SYSTEM; QUALITY CONTROL; STANDARD; TOTAL QUALITY MANAGEMENT;

CHEMICAL INDUSTRY; COMPUTER-AIDED DESIGN; DENSITOMETRY; MANUFACTURED MATERIALS; ONLINE SYSTEMS; POLYETHYLENE; QUALITY CONTROL; SPECTROSCOPY, FOURIER TRANSFORM INFRARED; TOTAL QUALITY MANAGEMENT;

EID: 1342286882     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/000370204322843011     Document Type: Article

References (20)

1. J. Workman, Jr., J. Near Infrared Spectrosc. 1, 221 (1993).
2. H. W. Siesler, in Near-Infrared Spectroscopy-Principles, Instruments, Applications, H. W. Siesler, Y. Ozaki, S. Kawata, and H. M. Heise, Eds. (Wiley-VCH, Weinheim, 2002), p. 247.
3. Y. Ozaki and T. Amari, in Spectroscopy in Process Analysis, J. M. Chalmers, Ed. (Sheffield Academic Press, New York, 2000), p. 53.
4. J. D. Tate, P. Chauvel, R. D. Guenard, and R. Harner, Handbook of Vibrational Spectroscopy, Vol. 4, J. M. Chalmers and P. R. Griffiths, Eds. (John Wiley and Sons, Chichester, 2002), p. 2737.
5. K. Molt and D. Ihlbrock, Fresenius' J. Anal. Chem. 348, 523 (1994).
6. R. C. Moessner, Proc. Control Qual. 2, 237 (1992).
7. Y. Thomas, K. C. Cole, E. Pellerin, and M. M. Dumoulin, Polym. Mater. Sci. Eng. 72, 19 (1995).
8. M. Shimoyama, T. Ninomiya, K. Sano, Y. Ozaki, H. Higashiyama, M. Watari, and M. Tomo, J. Near Infrared Spectrosc. 6, 317 (1998).
9. D. Fischer, T. Bayer, K. J. Eichhorn, and M. Otto, Fresenius' J. Anal. Chem. 359, 74 (1997).
10. S. Farquharson, P. B. Arnoudse, M. H. Wyckoff, and P. T. Keillor, Proc. SPIE-Int. Soc. Opt. Eng. 1172, 164 (1989).
11. A. Khettry and M. G. Hansen, Polym. Eng. Sci. 36, 1232 (1996).
12. T. Nagata, M. Ohshima, and M. Tanigaki, Polym. Eng. Sci. 40, 1843 (2000).
13. S. Ššić, Y. Kita, T. Furukawa, M. Watari, H. W. Siesler, and Y. Ozaki, Analyst (Cambridge, U.K.) 125, 2315 (2000).
14. T. Furukawa, Y. Kita, S. Sasao, K. Matsukawa, M. Watari, S. Ššić, H. W. Siesler, and Y. Ozaki, J. Near Infrared Spectrosc. 10, 195 (2002).
15. M. Watari, H. Higashiyama, and M. Tomo, 13th European Symposium on Polymer Spectroscopy (ESOPS-13), UK, 20-23 July (1998).
16. J. Mijovic and S. Andjelic, Macromolecules 29, 239 (1996).
17. K. Dittmar and H. W. Siesler, Fresenius' J. Anal. Chem. 306, 109 (1998).
18. D. C. Hassell and E. M. Bowman. Anal. Chem. 52, 18A (1998).
19. A. Olinga, R. Winzen, H. Rehage, and H. W. Siesler, J. Near Infrared Spectrosc. 7, 223 (2001).
20. M. M. Dumoulin, R. Gendron, and K. C. Cole, TRIP 4, 109 (1996).