Structure-dependent mixed valence of Sm on Cu(1 1 1) studied by XPS and STM

Surface Science

Volumn 552, Issue 1-3, 2004, Pages 53-62

  Nakayama, Yasuo ^a   Kondoh, Hiroshi ^a   Ohta, Toshiaki ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Copper; Growth; Lanthanides; Low energy electron diffraction (LEED); Scanning tunneling microscopy; Surface structure, morphology, roughness, and topography; X ray photoelectron spectroscopy

Indexed keywords

COPPER; CRYSTAL ORIENTATION; DIFFUSION; ELECTRONIC STRUCTURE; LOW ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SURFACE PHENOMENA; SURFACE ROUGHNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON CONFIGURATION; SURFACE ELECTRONIC PHENOMENA;

SAMARIUM;

EID: 1342283615     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.01.020     Document Type: Article

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