Epitaxial CrN(001) Grown and Analyzed in situ by XPS and UPS. I. Analysis of As-deposited Layers

Surface Science Spectra

Volumn 7, Issue 3, 2000, Pages 250-261

  Haasch, R T ^a   Lee, T Y ^a   Gall, D ^a   Greene, J E ^a   Petrov, I ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM COMPOUNDS; MAGNESIA; RUTHERFORD BACKSCATTERING SPECTROSCOPY;

DEPOSITED LAYER; KΑ; MONOCHROMATICS; PHOTOELECTRON SPECTROSCOPY (XPS); SPLITTINGS; XPS SPECTRUM;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 1342277012     PISSN: 10555269     EISSN: 15208575     Source Type: Journal    
DOI: 10.1116/1.1367617     Document Type: Article

References (2)

1. R. C.Powell, G. A.Tomasch, Y. W.Kim, J. A.Thornton, and J. E.Greene, in Diamond, Silicon Carbide and Related Wide Bandgap Semiconductors, edited by J. R.Glass, R. F.Messier, and N.Fujimori (MRS, Pittsburgh, 1990), p. 525.
2. W. K.Chu, J. W.Mayer, and M. A.Nicolet, Backscattering Spectrometry (Academic, New York, 1978), p. 81.