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Volumn 223, Issue 2, 2004, Pages 113-119
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Near-infrared diode laser spectroscopy of the HCSi radical
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Author keywords
2 + X 2 system; Harmonic force field; HCSi radical; Molecular constants; Near infrared diode laser spectroscopy; Renner Teller interaction; Rotational analysis; X 2 (010) state
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Indexed keywords
ABSORPTION;
BENDING (DEFORMATION);
DOPPLER EFFECT;
INFRARED SPECTROSCOPY;
LEAST SQUARES APPROXIMATIONS;
MOLECULAR VIBRATIONS;
PERTURBATION TECHNIQUES;
PRESSURE EFFECTS;
SEMICONDUCTOR LASERS;
HARMONIC FORCE FIELDS;
HCSI RADICALS;
MOLECULAR CONSTANTS;
NEAR INFRARED DIODE LASER SPECTROSCOPY;
RENNEER-TELLER INTERACTION;
ROTATIONAL ANALYSIS;
SILICON COMPOUNDS;
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EID: 1342265502
PISSN: 00222852
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jms.2003.10.006 Document Type: Article |
Times cited : (3)
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References (14)
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