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Volumn 223, Issue 2, 2004, Pages 113-119

Near-infrared diode laser spectroscopy of the HCSi radical

Author keywords

2 + X 2 system; Harmonic force field; HCSi radical; Molecular constants; Near infrared diode laser spectroscopy; Renner Teller interaction; Rotational analysis; X 2 (010) state

Indexed keywords

ABSORPTION; BENDING (DEFORMATION); DOPPLER EFFECT; INFRARED SPECTROSCOPY; LEAST SQUARES APPROXIMATIONS; MOLECULAR VIBRATIONS; PERTURBATION TECHNIQUES; PRESSURE EFFECTS; SEMICONDUCTOR LASERS;

EID: 1342265502     PISSN: 00222852     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jms.2003.10.006     Document Type: Article
Times cited : (3)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.