Analysis of phonons in graphene sheets by means of HREELS measurement and ab initio calculation

Surface and Interface Analysis

Volumn 37, Issue 2, 2005, Pages 133-136

  Yanagisawa, H ^a   Tanaka, T ^a   Ishida, Y ^a   Matsue, M ^a   Rokuta, E ^a   Otani, S ^b   Oshima, C ^a  

^a WASEDA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Ab initio calculation; Graphite; HREELS; Phonon

Indexed keywords

COMPUTATIONAL METHODS; CRYSTALLINE MATERIALS; DISPERSIONS; ELECTRON ENERGY LOSS SPECTROSCOPY; EPITAXIAL GROWTH; HIGH RESOLUTION ELECTRON MICROSCOPY; HONEYCOMB STRUCTURES; PHONONS;

AB INITIO CALCULATION; DISPERSION CURVES; GRAPHENE SHEETS; HIGH-RESOLUTION ELECTRON ENERGY-LOSS SPECTROSCOPY (HREELS);

SHEET METAL;

EID: 13244298374     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1948     Document Type: Conference Paper

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