The role of sol-gel procedure conditions in electrochemical behavior and corrosion stability of Ti/[RuO 2 -TiO 2 ] anodes

Materials and Manufacturing Processes

Volumn 20, Issue 1, 2005, Pages 89-103

  Panic V ^a   Dekanski, A ^a   Miskovic Stankovic V B ^b   Nikolic B ^b   Milonjic S ^c  

^a UNIVERSITY OF BELGRADE   (Serbia)

^b UNIVERSITY OF BELGRADE   (Serbia)

^c UNIVERSITY OF BELGRADE   (Serbia)

Author keywords

Aging time; Corrosion stability; Cyclic voltammetry; Electrochemical impedance spectroscopy; Forced hydrolysis; Oxide sols; Polarization measurements; Pore resistance; Pseudocapacitance; RuO 2 TiO 2 coating; SEM; Sol gel procedure; STM; TEM; XRD

Indexed keywords

ANODIC OXIDATION; CORROSION; CYCLIC VOLTAMMETRY; ELECTROCHEMISTRY; HYDROLYSIS; POLARIZATION; SPECTROSCOPY; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

AGING TIME; CORROSION STABILITY; FORCED HYDROLYSIS; OXIDE SOLS; POLARIZATION MEASUREMENTS; PORE RESISTANCE; RUO2-TIO2 COATING; SOL-GEL PROCEDURE;

SOL-GELS;

EID: 13244296990     PISSN: 10426914     EISSN: None     Source Type: Journal    
DOI: 10.1081/AMP-200041645     Document Type: Conference Paper

References (22)

1. Trasatti, S. Interfacial Electrochemistry of Conductive Oxides for Electrocatalysis. In Interfacial Electrochemistry - Theory, Experiment and Applications; Wieckowski, A., Ed.; Marcel Dekker Inc.: New York, 1999; 769-792.
2. Conway, B. In Electrochemical Supercapacitors - Scientific Fundamentals and Technological Applications; Plenum Publishers: New York, 1999.
3. Trasatti, S; Grady, W.O. In Advances in Electrochemistry and Electrochemical Engineering; Gerischer, H., Tobias, C.W., Eds.; Wiley: New York, 1981; Vol. 12, 177-261.
4. Ardizzone, S.; Trasatti, S. Adv. Colloid Interface Sci. 1996, 64, 173-251.
5. O'Sullivan, E.; White, J.J. Electrochem. Soc. 1989, 136, 2576-2587.
6. Lin, S.-M.; Wen, T.-C. J. Appl. Electrochem. 1995, 25, 73-79.
7. Zanta, C.L.P.S.; De Andrade, A.R.; Boodts, J.F.C. Electrochim. Acta 1999, 44, 3333-3340.
8. McKeown, D.; Hagans, P.; Carette, L.; Russell, A.; Swider, K.; Rolison, D. J. Phys. Chem. B 1999, 103, 4825-4832.
9. Zheng, J.P.; Jow, T.R. J. Electrochem. Soc. 1995, 142, L6-L7.
10. Zheng, J.; Cygan, P.; Jow, T. J. Electrochem. Soc. 1995, 142, 2699-2073.
11. Jow, T.; Zheng, J. J. Electrochem. Soc. 1998, 145, 49-52.
12. Park, K.-W.; Kwon, B.-K.; Choi, J.-H.; Park, I.-S.; Kim, Y.-M; Sung, Y.-E. J. Power Sources 2002, 109, 439-445.
13. Rolison, D.; Hagans, P.; Swider, K.; Long, J. Langmuir 1999, 15, 774-779.
14. Panić, V.; Dekanski, A.; Milonjić, S.; Atanasoski, R.; Nikolić, B. Colloids Surfaces A 1999, 157, 269-274.
15. Panić, V.; Dekanski, A.; Milonjić", S.; Atanasoski, R.; Nikolić, B. J. Serb. Chem. Soc., 2000, 65, 649-660.
16. Boucamp, B. Equivalent Circuit (EQUIVCRT.PAS) User Manual; Univ. Twente: Enschede, the Netherlands, 1989.
17. Mattos-Costa, F.I.; de Lima-Neto, P.; Machado, S.A.S.; Avaca, L.A. Electrochim. Acta 1998, 44, 1515-1523.
18. Panić, V.; Dekanski, A.; Milonjić, S.; Atanasoski, R.; Nikolić", B. Electrochim. Acta 2000, 46, 415-421.
19. Panić, V.; Dekanski, A.; Wang, G.; Fedoroff, M.; Milonjí, S.; Nikolić, B.J. Colloid Interface. Sci. 2003, 263, 68-73.
20. Dekanski, A.; Jovanović, V.M.; Despotov, P.; Nikolić, B.; Atanasoski, R.J. Serb. Chem. Soc. 1991, 56, 167-179.
21. Jovanović, V.M.; Dekanski, A.; Despotov, P.; Nikolić, B. Ž.; Atanasoski, R.T. J. Electroanal. Chem. 1992, 339, 147-165.
22. Tilak, B.V.; Birss, V.I.; Wang, J.; Chen, C.-P.; Rangarajan, S.K. J. Electrochem. Soc. 2001, 148, D112-D120.