Surface reconstructions in two and three dimensions: In on Si(111)

Surface and Interface Analysis

Volumn 37, Issue 2, 2005, Pages 110-114

  Pavlovska, A ^a   Bauer, E ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Low energy electron diffraction (LEED); Low energy electron microscopy (LEEM); Reconstructions; Thin film growth

Indexed keywords

CRYSTAL ORIENTATION; ELECTRON MICROSCOPY; LOW ENERGY ELECTRON DIFFRACTION; PACKING; SILICON; SUBSTRATES; SURFACE TREATMENT; THERMAL EFFECTS; TWO DIMENSIONAL;

LOW-ENERGY ELECTRON MICROSCOPY (LEEM); THIN-FILM GROWTH; THREE-DIMENSIONAL CRYSTALS; TWO-DIMENSIONAL PHASES;

SURFACE REACTIONS;

EID: 13244281814     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1943     Document Type: Conference Paper

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