AC/DC BIST for testing analog circuits

Proceedings - 12th Annual IEEE International ASIC/SOC Conference

Volumn , Issue , 1999, Pages 223-227

  Velasco Medina, J ^a   Rayane, I ^a   Nicolaidis, M ^a  

^a TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; BUILT-IN SELF TEST; CUTOFF FREQUENCY; ELECTRIC SIGNAL SYSTEMS; MIXED SIGNAL INTEGRATED CIRCUITS; OPERATIONAL AMPLIFIERS; TIMING CIRCUITS;

AC AND DC; ANALOG AND MIXED SIGNAL CIRCUITS; ANALOG FILTERS; TEST RESPONSE; TEST SIGNAL; TEST VEHICLE; WINDOW COMPARATOR;

ANALOG CIRCUITS;

EID: 13244280817     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASIC.1999.806509     Document Type: Conference Paper

References (11)

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