Electron detachment spectroscopic study on carbon and silicon cluster anions

Journal of Electron Spectroscopy and Related Phenomena

Volumn 142, Issue 3 SPEC. ISS., 2005, Pages 231-240

  Achiba, Y ^a   Kohno, M ^a,b   Ohara, M ^a   Suzuki, S ^a   Shiromaru, H ^a  

^a TOKYO METROPOLITAN UNIVERSITY   (Japan)

^b KYUSHU UNIVERSITY   (Japan)

Author keywords

Electron affinity; Electron detachment spectroscopic; Photoelectron spectra

Indexed keywords

CARBON; ION SOURCES; MAGNETIC FIELDS; MASS SPECTROMETRY; PHOTOIONIZATION; POSITIVE IONS; SILICON;

ELECTRON AFFINITY; ELECTRON DETACHMENT SPECTROSCOPIC STUDY; PHOTOELECTRON SPECTRA; SILICON CLUSTERS;

PHOTOELECTRON SPECTROSCOPY;

EID: 13244268576     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2004.09.016     Document Type: Article

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