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Volumn 118, Issue 2, 2005, Pages 322-331
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Characterization of sub-stoichiometric tungsten trioxide (WO3-X) using impedance spectroscopy
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Author keywords
Grain boundary; Impedance spectroscopy; Stoichiometry; Tungsten oxide
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Indexed keywords
CHEMICAL SENSORS;
ELECTRIC IMPEDANCE;
ELECTRON MICROSCOPY;
GRAIN BOUNDARIES;
LITHIUM BATTERIES;
MICROSTRUCTURE;
MOS DEVICES;
OXYGEN;
PHOTOELECTRIC DEVICES;
STOICHIOMETRY;
THICK FILMS;
THIN FILMS;
ELECTRICAL CHARACTERIZATION;
IMPEDANCE SPECTROSCOPY;
OXYGEN CONCENTRATION GRADIENTS (OCG);
TUNGSTEN OXIDE;
TUNGSTEN COMPOUNDS;
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EID: 13244267210
PISSN: 09244247
EISSN: None
Source Type: Journal
DOI: 10.1016/j.sna.2004.08.023 Document Type: Article |
Times cited : (20)
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References (15)
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