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Volumn 118, Issue 2, 2005, Pages 322-331

Characterization of sub-stoichiometric tungsten trioxide (WO3-X) using impedance spectroscopy

Author keywords

Grain boundary; Impedance spectroscopy; Stoichiometry; Tungsten oxide

Indexed keywords

CHEMICAL SENSORS; ELECTRIC IMPEDANCE; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; LITHIUM BATTERIES; MICROSTRUCTURE; MOS DEVICES; OXYGEN; PHOTOELECTRIC DEVICES; STOICHIOMETRY; THICK FILMS; THIN FILMS;

EID: 13244267210     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2004.08.023     Document Type: Article
Times cited : (20)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.