Enhancing BIST based single/multiple stuck-at fault diagnosis by ambiguous test set

Proceedings of the Asian Test Symposium

Volumn , Issue , 2004, Pages 216-221

  Takahashi, Hiroshi ^a   Yamamoto, Yukihiro ^a   Higami, Yoshinobu ^a   Takamatsu, Yuzo ^a  

^a EHIME UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; ELECTRIC FAULT CURRENTS; FAILURE ANALYSIS; INFORMATION ANALYSIS; NETWORKS (CIRCUITS); VECTORS;

CIRCUIT UNDER TEST (CUT); FAULT DIAGNOSIS; HIT RATIO; STUCK-AT-FAULTS;

BUILT-IN SELF TEST;

EID: 13244265473     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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