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Volumn 4, Issue 1, 2005, Pages 90-95

Effects of strong correlations in single electron traps in field-effect transistors

Author keywords

Impurities; Magnetoelectric effects; MOS devices; Tunneling

Indexed keywords

CRYSTAL LATTICES; ELECTRON TUNNELING; IMPURITIES; MAGNETIC FIELDS; MAGNETOELECTRIC EFFECTS; MATHEMATICAL MODELS; MOS DEVICES; PHONONS;

EID: 12944295091     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2004.840162     Document Type: Conference Paper
Times cited : (1)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.