Microinterferometric optical phase tomography for measuring small, asymmetric refractive-index differences in the profiles of optical fibers and fiber devices

Applied Optics

Volumn 44, Issue 3, 2005, Pages 316-327

  Bachim, Brent L ^a   Gaylord, Thomas K ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BIREFRINGENCE; COMPUTER SIMULATION; DIFFRACTION GRATINGS; ETCHING; INTERFEROMETRY; LIGHT INTERFERENCE; MATHEMATICAL MODELS; OPTICAL FIBERS; POLARIZATION; PROJECTION SYSTEMS; REFRACTIVE INDEX;

AXIAL SPATIAL RESOLUTION; FIBER DEVICES; OPTICAL PHASE TOMOGRAPHY; PARALLEL PROJECTION-BASED COMPUTED TOMOGRAPHY;

TOMOGRAPHY;

EID: 12844284562     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.000316     Document Type: Article

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