Nematic order melting on rough surfaces measured by surface plasmon resonance

Journal de Physique II

Volumn 6, Issue 2, 1996, Pages 205-214

  Papanek J ^a   Martinot Lagarde, Ph ^b  

^a Physics and Informatics   (Slovakia)

^b UNIVERSITÉ PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 12844273412     PISSN: 11554312     EISSN: None     Source Type: Journal    
DOI: 10.1051/jp2:1996177     Document Type: Article

References (29)

1. Barbero G., Durand G., Mol. Cryst. Liq. Cryst. 203 (1991) 33.
2. Wu Shin-Tson, Efron Uzi, Appl. Phys. Lett. 48 (1986) 624.
3. Haas G., Fritsch M., Wömłhler H., Mlynski D.A., Liq. Cryst. 5 (1989) 673.
4. Barberi R., Durand G., Phys. Rev. A41 (1990) 2207.
5. Sprokel G.J., Santo R., Swalen J.D., Mol. Cryst. Liq. Cryst. 68 (1981) 29.
6. Yang K.H., J. Appl. Phys. 53 (1982) 6742.
7. Chang Li, Zhao Jing-an, Wang Xin-jiu, Liq. Cryst. 2 (1987) 251.
8. Welford K.R., Sambles J.R., Appl. Phys. Lett. 50 (1987) 871.
9. Chao Nan-Ming, Chu K.C., Shen Y.R., Mol. Cryst. Liq. Cryst. 67 (1981) 261.
10. Elston S.J., Liq. Cryst. 9 (1991) 769.
11. Elston S.J., Sambles J.R., Mol. Cryst. Liq. Cryst. 200 (1991) 167.
12. Chu K.C., Chen C.K., Shen Y.R., Mol. Cryst. Liq. Cryst. 59 (1980) 97.
13. Wallis R.F., Brion J.J., Burstein E., Hartstein A., Phys. Rev. B9 (1974) 3424.
14. Otto A., Z. Phys. 216 (1968) 398.
15. Kretschmann E., Z. Phys. 241 (1971) 313.
16. Burstein E., Chen W.P., Chen Y.J., Harstein A., J. Vac. Sci. Technol. 11 (1974) 1004.
17. Berreman D.W., JOSA 62 (1972) 502.
18. Cuypers F., Pauwels H., Liq. Cryst. 3 (1988) 1157.
19. Allia P., Arlone M., Oldano C., Trossi L., Mol. Cryst. Liq. Cryst. 179 (1990) 253.
20. Weber W.H., McCarthy S.L., Appl. Phys. Lett. 25 (1974) 396.
21. Niklasson G.A., Granqvist C.G., J. Appl. Phys. 55 (1984) 3382.
22. Riviere D., Roger G.R., J. Phys. France 34 (1983) C10-113.
23. Welford K.R., Sambles J.R., Clark M.G., Liq. Cryst. 2 (1987) 91.
24. Monkade M., Martinot-Lagarde Ph., Durand G., private communication.
25. Landau L.D., Lifshitz E.M., Electrodynmics of Continuous Media (Nauka, Moscow, 1982).
26. Haller I., Huggins H.A., Freiser M.J., Mol. Cryst. Liq. Cryst. 16 (1972) 53.
27. Barbero G., Dozov I., Palierne J.F., Durand G., Phys. Rev. Lett. 56 (1986) 2056.
28. The length which measures the φ anchoring energy is close to 0.1 μm. The maximum energy corresponding to a perfect orientation on the surface has a length equal to the coherence length (8 nm). If one per cent of the molecules are oriented on the surface, the surface energy length has to be hundred times the coherence length or more (> 0.8 μm). I. Dozov, private communication.
29. Dubois-Violette E., de Gennes P.G., J. Phys. Lett. France 36 (1975) L-255.