Correlation between microstructure and mechanical spectroscopy of a Cu-Cu2O alloy between 290 K and 873 K

EPJ Applied Physics

Volumn 29, Issue 1, 2005, Pages 83-89

  Ngautcha, J P ^a   Gerland, M ^a   Kihn, Y ^b   Riviere A ^a  

^a ENSMA   (France)

^b CEMES CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; INTERNAL FRICTION; MICROSTRUCTURE; OXIDATION; SPECTROSCOPY; STRESS RELAXATION; TEMPERATURE DISTRIBUTION; THERMAL CONDUCTIVITY;

ANELASTICITY; DIRECT OBSERVATION OF DISLOCATIONS AND OTHER DEFECTS; INDIRECT EVIDENCE OF DISLOCATIONS OF OTHER DEFECTS; MECHANICAL RESONANCE;

COPPER ALLOYS;

EID: 12844271111     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:2004200     Document Type: Article

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