Calibration and characterization of chino 900 nm silicon narrow-band radiation thermometer

Proceedings of the SICE Annual Conference

Volumn , Issue , 2004, Pages 2327-2331

  Sakuma, F ^a   Ma, L ^a   Suzuki, T ^b   Kobayashi, T ^b   Nakanishi, A ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b Chino Corporation   (Japan)

Author keywords

Calibration; Fixed point blackbody; Radiation thermometer; Spectral responsivity

Indexed keywords

CALIBRATION; CHARACTERIZATION; FEEDBACK; SILICON; SPECTRUM ANALYSIS; TEMPERATURE MEASUREMENT;

FIXED-POINT BLACKBODY; OUT-OF-BAND SUPPRESSION; RADIATION THERMOMETER; SPECTRAL RESPONSIVITY;

THERMOMETERS;

EID: 12744279386     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. F. Sakuma and L. Ma, "Calibration and Characterization of 900 nm Silicon Narrow-Band Radiation Thermometers" Proc. SICE Annual Conf. SICE03-0128 (2003)
2. F. Sakuma and S. Hattori, "A practical-type fixed-point blackbody", Temperature, Its Measurement and Control in Science and Industry ed. By J.F. Schooley, AIP Vol. 5, (1982) pp. 421/427
3. F. Sakuma and M. Kobayashi, "Interpolation equations of scales of radiation thermometers", Proc. Tempmeko'96, Torino 305/310 (1997)
4. L. Ma and F. Sakuma, "Nonlinearity characteristics of radiation thermometer", Proc. SICE Annual Conf. SICE03-0118 (2003)
5. F. Sakuma, L. Ma and Z Yuan, "Distance effect and size-of-source effect of radiation thermometers", Proc. Tempmeko'0l, Berlin Vol.1 161/166 (2001)