Image-based nanocrystallography in future aberration-corrected transmission electron microscopes

Materials Research Society Symposium Proceedings

Volumn 818, Issue , 2004, Pages 247-252

  Moeck, P ^a   Qin, W ^b   Fraundorf, P B ^c  

^a PORTLAND STATE UNIVERSITY   (United States)

^b MOTOROLA INC   (United States)

^c UNIVERSITY OF MISSOURI ST LOUIS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; CRYSTALLOGRAPHY; DIAMONDS; ERROR CORRECTION; MORPHOLOGY; OPTIMIZATION; TRANSMISSION ELECTRON MICROSCOPY;

CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); NANOCRYSTALLOGRAPHY; TRANSMISSION ELECTRON GONIOMETRY;

NANOSTRUCTURED MATERIALS;

EID: 12744250261     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-818-m11.3.1     Document Type: Conference Paper

References (21)

1. M.J. Pitkethly, Nanoparticles as building blocks, nanotoday, p. 36-42 (2003), http://www.materialstoday.com/nanotoday.htm), supplement to Materials Today 6 (12) 2003.
2. M.J. Pitkethly, Nanoparticles as building blocks, nanotoday, p. 36-42 (2003), http://www.materialstoday.com/nanotoday.htm), supplement to Materials Today 6 (12) 2003.
3. Y. Gogotsi, S. Welz, D.A. Ersoy and M.J. McNallan, "Conversion of Silicon Carbide to Crystalline Diamond-Structured Carbon at Ambient Pressure", Nature 411, 283-287 (2001).
4. S. Welz, private conversation.
5. W. A. Jesser, G.J. Shiflet, G.L. Allen and J.L. Crawford, Equilibrium phase diagrams of isolated nano-phases, Mat. Res. Innovat. 2, 211-216 (1999).
6. M. Wautelet, Effects on size, shape and environment on the phase diagrams of small structures, Nanotechnology 3, 42-43 (1992).
7. M. Wautelet, Size and segregation effects on the phase diagrams of nanoparticles of binary systems, Nanotechnology 12, 68-74 (2001).
8. W.M. Tolles, Self-Assembled Materials, MRS Bulletin 25 36-38 (2000).
9. D.B. Williams and C.B. Carter, Transmission Electron Microscopy: a Textbook for Materials Science, (Plenum Press, New York, 1996).
10. rd TEAM workshop: http://nccm.lbl.gov/TEAM3 wkshp rpt.pdf
11. P. Fraundorf, "Determining the 3D Lattice Parameters of Nanometer-sized Single Crystals from Images", Ultramicroscopy 22, 225-230 (1987).
12. P. Möck, Verfahren zur Durchführung und Auswertung von elektronenmikroskopischen Untersuchungen, German patents DE 4037346 Al and DD 301839 A7, priority date: 21 November, 1989.
13. P. Fraundorf, Stereo Analysis of Single Crystal Electron Diffraction Data, Ultramicroscopy 6, 227-236 (1981).
14. P. Fraundorf, Stereo Analysis of Electron Diffraction Pattern from Known Crystals, Ultramicroscopy 7, 203-206 (1981).
15. P. Mock, A Direct Method for Orientation Determination Using TEM (I), Description of the Method. Cryst. Res. Technol. 26, 653-658 (1991); A Direct Method for Orientation Determination Using TEM (II), Experimental Example, Cryst. Res. Technol. 26, 797-801 (1991).
16. P. Mock, A Direct Method for Orientation Determination Using TEM (I), Description of the Method. Cryst. Res. Technol. 26, 653-658 (1991); A Direct Method for Orientation Determination Using TEM (II), Experimental Example, Cryst. Res. Technol. 26, 797-801 (1991).
17. P. Möck, A Direct Method for the Determination of Orientation Relationships Using TEM, Cryst. Res. Technol. 26, 975-962 (1991).
18. W. Qin and P. Fraundorf, Lattice parameters from direct-space images at two tilts, Ultramicroscopy 94, 245-262 (2003).
19. P. Fraundorf and W. Qin, Fringe Visibility Maps, Micros. Microanal. 7 (Suppl. 2), 272-273 (1999).
20. W. Qin and P. Fraundorf, Correlating Lattice Fringe Visibility with Nanocrystal Size and Orientation, Los Alamos Archives, http://arXic.org, document http://xxx.lanl.gov/abs/cond-mat/0212281, (2002).
21. CEOS GmbH, Englerstr. 28, D-69126 Heidelberg, Federal Republic of Germany, Tel.: +49 6221 89467-0, Fax: +49 6221 89467-29, http://www.ceos-gmbh.de/.