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Volumn 410-411, Issue , 1997, Pages 111-114

XPS and in-situ IR investigation of Ru/SiO2 catalyst

Author keywords

In situ IR; Ru catalyst; XPS

Indexed keywords


EID: 12644315042     PISSN: 00222860     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-2860(96)09637-8     Document Type: Conference Paper
Times cited : (35)

References (11)
  • 2
    • 0003828439 scopus 로고
    • Auger and X-ray Photoelectron Spectroscopy, D. Briggs and M. Seah (Eds.), 2nd edn., Wiley, Chichester
    • T.L. Barr, in Auger and X-ray Photoelectron Spectroscopy, D. Briggs and M. Seah (Eds.), Practical Surface Analysis, Vol. 1, 2nd edn., Wiley, Chichester, 1994.
    • (1994) Practical Surface Analysis , vol.1
    • Barr, T.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.