Advanced Thick-film Technology - The New Generation

Microelectronics International

Volumn 14, Issue 3, 1997, Pages 51-53

  Barnwell, P ^a   Wood, J ^a  

^a Heraeus Incorporated Arizona   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 12644263386     PISSN: 13565362     EISSN: None     Source Type: Journal    
DOI: 10.1108/13565369710800574     Document Type: Article

References (4)

1. Amey, D. L. and Horowitz, S., 'Microwave Material Characterization', Proceedings International Symposium on Microelectronics, Minneapolis, pp. 494-499, October (1996).
2. Troughton, P., 'High Q-Factor Resonators in Microstrip', Electronics Letters, Vol. 4, No. 24, pp. 520-522, November (1968).
3. Troughton, P., 'Measurement Techniques in Microstrip', Electronics Letters, Vol. 5, pp. 25-26 (1969).
4. Huang, H., Free, C., Pitt, K., Berzins, A. and Shorthouse, G., 'High Frequency Measurements on Modern MCM Structures', International Journal of Microcircuits & Electronic Packaging, Vol. 18, No. 4, pp. 357-362 (1995).