A quantitative measure for the quality of INSAR interferograms based on phase differences

Photogrammetric Engineering and Remote Sensing

Volumn 70, Issue 10, 2004, Pages 1131-1137

  Li, Zhilin ^a   Zou, Weibao ^a   Ding, Xiaoli ^a   Chen, Yongqi ^a   Liu, Guoxiang ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATA REDUCTION; DEFORMATION; INSPECTION; INTERFEROMETRY; RELIABILITY; SPECKLE;

DIGITAL ELEVATION MODELS (DEM); INTERFEROMETRIC SYNTHETIC APERTURE RADAR (INSAR); PIXELS; SUM OF PHASE DIFFERENCES (SPD);

SYNTHETIC APERTURE RADAR;

DIGITAL ELEVATION MODEL; IMAGE ANALYSIS; INTERFEROMETRY; MEASUREMENT METHOD; PIXEL; SYNTHETIC APERTURE RADAR;

EID: 12544260282     PISSN: 00991112     EISSN: None     Source Type: Journal    
DOI: 10.14358/PERS.70.10.1131     Document Type: Conference Paper

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