Neural network based modeling of PL intensity in PLD-grown ZnO thin films

Journal of Materials Processing Technology

Volumn 159, Issue 2, 2005, Pages 159-163

  Ko, Young Don ^a   Kang, Hong Seong ^a   Jeong, Min Chang ^a   Lee, Sang Yeol ^a   Myoung, Jae Min ^a   Yun, Ilgu ^a  

^a Yonsei University   (South Korea)

Author keywords

Artificial neural networks; Diffusion; Modeling; Pulsed laser deposition

Indexed keywords

DIFFUSION; MATHEMATICAL MODELS; NEURAL NETWORKS; OPTIMIZATION; PHOTOLUMINESCENCE; PULSED LASER DEPOSITION; RADIAL BASIS FUNCTION NETWORKS; STATISTICAL METHODS; ZINC OXIDE;

INPUT FACTORS; MICROACCELEROMETERS; MODELING METHODOLOGY; PROCESS FLUCTUATIONS;

THIN FILMS;

EID: 12444339391     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmatprotec.2004.05.002     Document Type: Article

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