Variable-temperature structural studies of tetranatrolite from Mt. Saint-Hilaire: Synchrotron X-ray powder diffraction and Rietveld analysis

American Mineralogist

Volumn 90, Issue 1, 2005, Pages 247-251

  Lee, Yongjae ^a,b   Hriljac, Joseph A ^c   Vogt, Thomas ^a,b  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION ALGORITHMS; CALCIUM COMPOUNDS; CRYSTAL STRUCTURE; DEHYDRATION; DIFFRACTION; MOLECULES; POSITIVE IONS; RIETVELD ANALYSIS; SILICON; SINGLE CRYSTALS; X RAY POWDER DIFFRACTION; X RAYS; ZEOLITES;

APPROXIMATE FORMULAS; SINGLE-CRYSTAL STUDY; STRUCTURAL MODELING; STRUCTURAL STUDIES; SYNCHROTRON X RAY POWDER DIFFRACTION; TEMPERATURE DEPENDENT; TEMPERATURE INCREASE; VARIABLE TEMPERATURE;

SODIUM COMPOUNDS;

CRYSTAL STRUCTURE; DEHYDRATION; GONNARDITE; RIETVELD ANALYSIS; TEMPERATURE EFFECT; WATER CONTENT; X-RAY DIFFRACTION;

EID: 12444301837     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2005.1696     Document Type: Article

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