메뉴 건너뛰기




Volumn 11, Issue 1, 2005, Pages 16-22

IEEE reliability indices standards

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; COMPETITION; DEREGULATION; ELECTRIC INDUSTRY; ELECTRIC POWER UTILIZATION; ELECTRIC UTILITIES; LAWS AND LEGISLATION; PUBLIC POLICY; RELIABILITY; STANDARDS;

EID: 12444270114     PISSN: 10772618     EISSN: None     Source Type: Journal    
DOI: 10.1109/MIA.2005.1380322     Document Type: Article
Times cited : (18)

References (3)
  • 1
    • 12444323791 scopus 로고    scopus 로고
    • "Changing regulation and its implication"
    • Dallas, TX
    • C.A. Warren and J.D. Bouford, "Changing regulation and its implication," in Proc. IEEE T&D Conf., Dallas, TX, 2003.
    • (2003) Proc. IEEE T&D Conf.
    • Warren, C.A.1    Bouford, J.D.2
  • 2
    • 12444345994 scopus 로고    scopus 로고
    • "Statistical classification of major reliability event days in distribution systems"
    • [Online]. Available:
    • R.D. Christie, "Statistical classification of major reliability event days in distribution systems" [Online]. Available: http:// grouper.ieee.org/groups/td/dist/sd/doc/
    • Christie, R.D.1
  • 3
    • 12444292389 scopus 로고    scopus 로고
    • Comapring methods of major event day identification for data sets with zero SAIDI days
    • Aug. 26, [Online]. Available:
    • R.D. Christie (Aug. 26, 2003). Comapring methods of major event day identification for data sets with zero SAIDI days [Online]. Available: http://grouper.ieee.org/groups/td/dist/sd/doc/
    • (2003)
    • Christie, R.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.