Nanocrystallization of Al92Sm8 studied by electrical resistivity - Formation of monatomic Sm spherical layer

Nanotechnology

Volumn 16, Issue 1, 2005, Pages 169-174

  Lukaszuk L ^a   Pekala K ^b  

^a SOLTAN INSTITUTE FOR NUCLEAR STUDIES   (Poland)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; AMORPHIZATION; ANNEALING; CRYSTALLIZATION; DIFFERENTIAL SCANNING CALORIMETRY; ELECTRIC CONDUCTIVITY; ELECTRON TRANSPORT PROPERTIES; FRACTURE TOUGHNESS; GRAIN BOUNDARIES; MELT SPINNING; X RAY DIFFRACTION;

AMORPHOUS STRUCTURE; DIFFUSION FIELD IMPINGEMENT; GRAIN SURFACE; NANOCRYSTALLIZATION;

NANOSTRUCTURED MATERIALS;

EID: 12444261755     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/1/032     Document Type: Article

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