The use of an optically trapped microprobe for scanning details of surface

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5259, Issue , 2003, Pages 166-169

  Šerý, Mojmír ^a,b   Jákl, Petr ^a   Ježek, Jan ^a   Jonáš, Alexandr ^a   Zemánek, Pavel ^a   Liška, Miroslav ^b  

^a INSTITUTE OF SCIENTIFIC INSTRUMENTS   (Czech Republic)

^b BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

Microscopy; Optical tweezers; Surface profiling; Two photon fluorescence

Indexed keywords

FLUORESCENCE; LASER BEAMS; MICROSCOPES; MONITORING; PROFILOMETRY; SCANNING;

OPTICAL TWEEZERS; SURFACE PROFILING; TWO-PHOTON FLUORESCENSE;

PROBES;

EID: 1242352584     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.545118     Document Type: Conference Paper

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