Tolerance of septoria leaf blotch in winter wheat

Plant Pathology

Volumn 53, Issue 1, 2004, Pages 1-10

  Parker, S R ^a,d   Welham, S ^b   Paveley, N D ^a   Foulkes, J ^c   Scott, R K ^c  

^a ADAS BOXWORTH   (United Kingdom)

^b ROTHAMSTED RESEARCH   (United Kingdom)

^c UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^d CENTRAL SCIENCE LABORATORY   (United Kingdom)

Author keywords

Disease tolerance; Mycosphaerella graminicola REML; Residual maximum likelihood; Septoria tritici; Wheat yield loss

Indexed keywords

CROP YIELD; DISEASE RESISTANCE; DISEASE SEVERITY; FUNGAL DISEASE; WHEAT;

GRAMINICOLA; MYCOSPHAERELLA; MYCOSPHAERELLA GRAMINICOLA; SEPTORIA; TRITICUM; TRITICUM AESTIVUM;

EID: 1242345253     PISSN: 00320862     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1365-3059.2004.00951.x     Document Type: Article

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